| Marchio: | ZMSH |
| Numero di modello: | Wafer SiC tipo 4H/6H-P |
| MOQ: | 10 pezzi |
| Dettagli dell' imballaggio: | pacchetto personalizzabile |
| Condizioni di pagamento: | T/t |
A P-type silicon carbide (SiC) wafer is a semiconductor substrate that is doped with impurities to create a P-type (positive) conductivity. Silicon carbide is a wide-bandgap semiconductor material that offers exceptional electrical and thermal properties, making it suitable for high-power and high-temperature electronic devices.
In the context of SiC wafers, "P-type" refers to the type of doping used to modify the conductivity of the material. Doping involves intentionally introducing impurities into the crystal structure of the semiconductor to alter its electrical properties. In the case of P-type doping, elements with fewer valence electrons than silicon (the base material for SiC) are introduced, such as aluminum or boron. These impurities create "holes" in the crystal lattice, which can act as charge carriers, resulting in a P-type conductivity.
P-type SiC wafers are essential for fabricating various electronic components, including power devices like metal-oxide-semiconductor field-effect transistors (MOSFETs), Schottky diodes, and bipolar junction transistors (BJTs). They are typically grown using advanced epitaxial growth techniques and are further processed to create specific device structures and features required for different applications.
| Parameter | Z Grade | P Grade | D Grade |
|---|---|---|---|
| Diameter | 99.5 mm~100.0 mm | ||
| Thickness | 350 μm ± 25 μm | ||
| Wafer Orientation | Off axis: 2.0°-4.0° toward {11-20} ± 0.5° for 4H/6H-P | ||
| Micropipe Density | 0 cm-2 | ||
| Resistivity | ≤0.1 Ω.cm | ≤0.3 Ω.cm | |
| Primary Flat Orientation | {10-10} ±5.0° | ||
| Primary Flat Length | 32.5 mm ± 2.0 mm | ||
| Secondary Flat Length | 18.0 mm ± 2.0 mm | ||
| Secondary Flat Orientation | Silicon face up: 90° CW from Prime flat ± 5.0° | ||
| Edge Exclusion | 3 mm | 6 mm | |
| LTV/TTV/Bow/Warp | ≤2.5 μm/≤5 μm/≤15 μm/≤30 μm | ≤10 μm/≤15 μm/≤25 μm/≤40 μm | |
| Roughness | Polish: Ra≤1 nm CMP: Ra≤0.2 nm |
Ra≤0.5 nm | |
| Edge Cracks By High Intensity Light | None | Cumulative length ≤10 mm, single length≤2 mm | |
| Hex Plates By High Intensity Light | Cumulative area ≤0.05% | Cumulative area ≤0.1% | |
| Polytype Areas By High Intensity Light | None | Cumulative area≤3% | |
| Visual Carbon Inclusions | Cumulative area ≤0.05% | Cumulative area ≤3% | |
| Silicon Surface Scratches By High Intensity Light | None | Cumulative length≤1×wafer diameter | |
| Edge Chips High By Intensity Light | None permitted ≥0.2mm width and depth | 5 allowed, ≤1 mm each | |
| Silicon Surface Contamination By High Intensity | None | ||
| Package | Multi-wafer Cassette or Single Wafer Container | ||
6-Inch Silicon Carbide (SiC) Wafer for AR glasses MOS SBD
ZMKJ provides high quality single crystal SiC wafer (Silicon Carbide) to electronic and optoelectronic industry. SiC wafer is a next generation semiconductor material, with unique electrical properties and excellent thermal properties, compared to silicon wafer and GaAs wafer, SiC wafer is more suitable for high temperature and high power device application. SiC wafer can be supplied in diameter 2-12 inch, both 4H and 6H SiC, N-type, Nitrogen doped, P-Type, semi-insulating type and 3C-N type available.